  | |  | Sehr geehrte Damen und Herren
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| We kindly invite you to participate in SID Display Week taking place in San Jose, CA/USA May 14-16th, 2019. Instrument Systems will exhibit high-end measurement systems for “Display Quality Control”, “AR/VR-Measurement” and “Display Production Testing”. The Society for Information Display has selected our latest product innovation to be shown at the Innovation-Zone: We will present an ultra-high resolution model of the LumiTop, which has been developed for subpixel metrology of Micro-LEDs and OLEDS. Take advantage and discuss innovative applications for this new imaging colorimeter with our display experts onsite!
Get a complimentary exhibit hall pass, valid also for the keynotes and the SID´s I-Zone! Just click here and use the Code: KAgZyJuS
We are looking forward to your visit in the I-Zone and at our booth # 1528!
Your Instrument Systems Team
sales@instrumentsystems.com
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| | | \\ HIGHLIGHTS AT A GLANCE
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| Subpixel metrology of MicroLED and AR/VR display applications
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At Display Week Exhibition in San Jose, CA / USA from May 14 - 16th Instrument Systems GmbH will put spotlight on applications representing the major trend in the display industry: more pixels. µLEDs are a strong candidate for the realization of very high display resolutions with pixel sizes as small as 10 µm and equally small pixel pitches. A higher resolution means that imaging light measurement devices must advance accordingly.
Within its LumiTop series, Instrument Systems developed an ultra-high resolution camera with an extraordinary technical design and outstanding measuring portfolio for unprecedented accuracy and high speed 2D measurements. In the Innovation-Zone of the Display Week Exhibition the light measuring device will be presented in an application for display testing in production lines where tact times are extremely short.
At Instrument Systems GmbH booth #1528 the LumiTop is showcased with a head-mounted display to be measured as innovative AR/VR display application. Additionally, high-end measurement systems for quality control, automotive applications, and production testing will be presented by our light measurement experts.
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| | Display Week Lectures | |
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| Instrument Systems actively participates in presentations and discussions at the Display Week Symposium 2019 and presents three lectures on current topics in display metrology:
May 13 / Session 06 / 10:20-11:50 AM / Room LL21ABC
"Display Metrology: Basics, Framework, and Applications"
May 16 / Session 50.1 / 09:00-10:20 AM / Room LL20A
"Flicker from Electronic Displays: Reconsidering the Confusion"
Co-Chair: Jürgen Neumeier, Instrument Systems
May 17 / Session 83.1 / 10:40-11:00 AM / Room LL20A
"OLED vs. LC Displays - The Race toward Rec. 2020 and HDRI"
Speaker: Dr. Michael Becker, Instrument Systems
Interested in lecture abstracts?
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| | CIE 2019, 29th Session in Washington | |
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| The CIE is a scientific non-profit organization that provides an international forum relating to the science, technology and art in the fields of light and lighting. The CIE develops basic standards and procedures of metrology and maintains interaction with other international organizations. Instrument Systems supports the work of the CIE and is regularly active with lectures and as a sponsor at CIE conferences.
CIE 2019 29th Quadrennial Session
June 14 - 22, 2019 / Washington DC, USA
"Evaluation of Blue Light Hazard"
Speaker: Dr. Ðenan Konjhodžić, Instrument Systems
Interested in lecture abstracts?
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On-the-Fly Light Measurement of Modulated LEDs | |
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Instrument Systems addresses increasing demands on light measurement technology in the automotive sector: the goniophotometer AMS 5000 combined with the DSP 200 photometer offers a perfect solution for testing modulated LEDs, which today ensure a driving experience under optimum lighting conditions.
Complete article published on led-professional.com:
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| | | \\ UPCOMING EVENTS - MEET US IN PERSON! |
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