Newsletter May 2021 
Instrument Systems
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Dear Karin
 
On May 20, three leading manufacturers of light measurement technology will jointly present a short course on “Fundamentals in Display Metrology” at Display Week! Together with Konica Minolta and Radiant Vision Systems, Instrument Systems will give a lecture from basics to current topics of test methods to analyze display performance parameters. The lecture features mura, pixel uniformity, flicker, and the latest metrology solutions for testing emerging displays from µLED to AR/VR devices.
 
Register now for access to Display Week on May 17-21, 2021:
http://www.displayweek.org/2021/Attendee/Registration
 
More information about the short course, our additional talk on May 21 as well as the virtual exhibition we will give you in this newsletter below. If displays are not of prime importance for you, we will recommend a general study on short pulse testing of temperature-sensitive high-power LEDs with our measuring devices (blue box below).
 
Your Instrument Systems Team
sales@instrumentsystems.com
Tel.: +49-89-454943-0
\\ AT A GLANCE
Short Course S-2: Fundamentals of Display Metrology
Meet the complete characterization of AR/VR devices
Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing
Reliable characterization of temperature-sensitive, high-power LEDs
\\ HIGHLIGHT
SC2 ppt
Short Course S-2: Fundamentals of Display Metrology
 
As part of the virtual Display Week Program, Dr. Reto Häring, Vice President Customer Solutions, will co-present a Short Course with members from Radiant Vision Systems and Konica Minolta. The course "Fundamentals of Display Metrology" will cover the principles and applications of display metrology, and introduce measurement equipment and techniques. Topics include the science of light and color, units of measurement, measurement standards, light measurement devices from spot meters to imaging equipment, test methods to quantify display performance parameters like mura, pixel uniformity, flicker, and the latest metrology solutions for testing emerging displays from µLED to AR/VR devices.
Presented by Dr. Reto Häring (Instrument Systems), Jens Jensen (Radiant Vision Systems), and Yutaka Maeda (Konica Minolta)
 
Available to view online Thursday 5/20/2021
 
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\\ DISPLAY WEEK EXHIBITION
arvrportfolio
Meet the complete characterization of AR/VR devices

 
In order to meet the perfect user experience for AR/VR headsets, Instrument Systems has developed the LumiTop AR/VR 2D imaging colorimeter. Its lens simulates the human eye and measures color and luminance exactly as seen by the user. The unique periscope design enables synchronized two-eye measurements. Besides the virtual display, AR/VR head-sets contain several more types of light sources and sensors. Also for those, Instrument Systems offers testing solutions, e.g. for the IR sources (NIR LED, VCSEL) often used for gesture and object recognition within an AR/VR headset.
 
- Virtual image test with LumiTop AR/VR
- Image source pixel test with LumiTop X150 up to 600 MP
- Angular resolved spectra with DMS goniometer
- 3D gesture recognition sensor test with far-field emission camera
- Time-of-flight sensor testing for pulses down to 1 ns
 

Take a Preview on LumiTop X20

 
A special highlight at Display Week 2021 will be the preview of the new LumiTop X20, upcoming in autumn 2021. Building on the established 2700 and 4000 models, the LumiTop X20 will offer a high-resolution camera, a flexible field of view and a high dynamic range for both high and low luminance measurements. Target applications for the X20 are the measurement of homogeneity (particularly high/low luminance) and defect detection.
 
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\\ DISPLAY WEEK Presentation
lectures
Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing

 
Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission band-width and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.
 
Dr. Tobias Steinel, Friday 5/21/2021
 
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\\ TECHNICAL PAPER in LED Professional Review 1/21

article
Reliable characterization of temperature-sensitive, high-power LEDs

 
A recent study has shown that at typical measurement conditions short-pulses of less than 40 microseconds are required for the undistorted characterization of next-generation LEDs (cf. LED Professional Review 1/21, “Short-pulse testing eliminates self-heating errors to produce true L-I graphs”). A heat-induced decline in performance can be significantly reduced and the roll-over effect avoided with such short-pulse testing (see figure).
 
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\\ MEET US DIGITALLY!
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Email
 
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instrumentsystems.com
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